2014 ASIS&T SIG/MET Student Paper Contest
Are you tired of preparing papers which immediately migrate into your professors’ files and have not been seen ever since? Recover your papers and give them a life and a great opportunity for yourself. Send your most promising papers to the 2014 ASIST SIG/MET Student paper contest where you have the chance to present your work in front of an interested audience, discuss it with established researchers, and win the ASIS&T SIG/MET Student Paper Award.
This is the fourth annual student paper contest for SIG/MET, the Special Interest Group for the measurement of information production and use (http://www.asis.org/SIG/met.html)of the Association for Information Science & Technology (ASIS&T<http://www.asis.org/>). The contest is designed to recognize promising student research relating to the measurement of information, publication, and research and gives students a forum to meet the leaders of the field.
SIG/MET seeks to encourage the development and networking opportunities of all those interested in the measurement of information. It is holding this contest to foster student growth and promote the generation of new ideas and research in metric-related topics, including bibliometrics, scientometrics, informetrics, altmetrics and other related domains.
The first author of the paper entered into this contest must be a full-time student at the time of submission, irrespective of ASIS&T or SIG/MET membership. Only solo or first authored student manuscripts will be accepted, in order to ensure that the student made significant contributions to the work. SIG/MET reserves the right to request proof of enrollment as part of the submission and evaluation process. Submissions should not have been published work, although they may be submitted to a journal at the time of submission to the contest.
Papers should discuss theories, methods, policies, case studies, etc. on aspects of the measurement of information production and use. Topics could include, but are not limited to, the following core areas:
- Metric-Related Theory
- Methods and new techniques
- Citation and co-citation analysis
- Web metrics
- Information visualization
- Research policy
- Journals, databases and electronic publications
- Patent analysis
- Knowledge and topic diffusion
Papers will be reviewed by SIG/MET officers and advisors to the SIG/MET workshop. At least one winner will be chosen. In the past, we have also given commendation to other particularly outstanding papers. Selection criteria include those that would be considered in traditional peer review: that is, the quality of the research, the presentation of the results, and the originality of the research question.
The winner will be awarded a one-year individual membership to ASIS&T and a cash prize, sponsored by Elsevier. If of sufficient merit and pending available funds, two winners may be announced: one for the best first-authored paper and one for the best sole-authored paper. Authors of highly rated papers will be invited to submit a short biographical piece to be featured on the SIG/MET website. In addition, these authors may be invited to present their research under their own expense at the SIG/MET pre-conference workshop at the 2014 Annual ASIS&T Meeting.
Submissions can be of any length and format, but should ideally reflect typical standards of a journal article (i.e., approximately 6,000 words and in an appropriate citation style for the social sciences).
Submission & Deadline
Authors are invited to submit manuscripts by midnight EST on Wednesday, August 13 2014, to the following website: https://www.easychair.org/conferences/?conf=sigmetspc2014
The students will be notified about the results by September 1, 2014. For inquiries and further information please contact Kim Powell (email@example.com<mailto:firstname.lastname@example.org>).
SIGMET, a Special Interest Group for the measurement of information production and use of the Association for Information Science & Technology. It is designed to foster student research in metric-related topics: bibliometrics, scientometrics, atlmetrics, etc.